Late News Abstract Submission Deadline: July 15 (Opens June 13)
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Technical Program

The 2022 International Conference on Secondary Ion Mass Spectrometry (SIMS 23) will be held September 18-23, 2022, at the Hyatt Regency Minneapolis in Minneapolis, Minnesota, USA. SIMS 23 will provide a forum for colleagues from academic, industrial, and national laboratories throughout the world to exchange results and new ideas on Secondary Ion Mass Spectrometry and related techniques. The conference will cover advancements of scientific knowledge from fundamentals to applications. In light of future requirements coming from technology and basic research, updates on present possibilities and future developments of the technique are particularly solicited for dedicated discussion sessions.

SIMS School – an IUVSTA Short Course

September 18, 2022
Session 1: “Fundamentals of SIMS – Views from ground zero and beyond,” Arnaud Delcorte, Université Catholique de Louvain
Session 2: “SIMS Analysis of Biological Materials,” Chris Anderton, PNNL
Session 3: “SIMS Analysis of Organic Materials with Industrial Applications,” Michaeleen Pacholski, Dow Chemical Company
Session 4: “SIMS inorganic depth profiling,” Jerry Hunter, University of Wisconsin
Session 5: “Multivariate Analysis Methods for Secondary Ion Mass Spectrometry and Related Techniques,” Jean-Paul Barnes, CEA-LETI – Grenoble

SIMS Plenary Speakers

  • Valley, John (University of Wisconsin-Madison, USA), “Isotope Analysis in Earth Science”
  • Wysocki, Vicki (Ohio State University, USA), “The Role of Surface Collisions in Native Mass Spectrometry/Structural Biology”

SIMS Invited Speakers

  • Groopman, Evan (NIST, USA), “NRL’s NAUTILUS: Combining SIMS & SSAMS for Direct Trace Analysis”
  • Lee, Tae Geol (KRISS, Republic of Korea), “Implications of Delayed Extraction and External Calibrants to Measure Large Biomolecules by Using Ar-GCIB ToF-SIMS”
  • Matsuo, Jiro (Kyoto University, Japan), “Chemical Structure of Organic Molecules Sputtered with Cluster Ions”
  • Moon, DaeWon (DGIST, Republic of Korea), “Ambient Mass Spectrometric Imaging of Cells and Tissues”
  • Perea, Daniel (PNNL, USA), “Developing the Application of Atom Probe Tomography to Hydrated Biological Materials”
  • Scurr, David (University of Nottingham, United Kingdom), “Elucidation of Molecular Composition in Organic Chemistries and Protein Identification by 3D OrbiSIMS”
  • Steinhauser, Matthew (University of Pittsburg, USA), “Biological Explorations with NanoSIMS: From Cells to Humans”
  • Tarolli, Jay (Ion Path, USA), “Spatially Mapping Single Cells in Diseased Tissue with Multiplexed Ion Beam Imaging”
  • Terlier, Tanguy (Rice University, USA), “Advances in Polymer Science by ToF-SIMS Depth Profiling”
  • Van Nuffel, Sebastiaan (Maastricht University, The Netherlands), “Answering Biomedical Questions Using Integrative ToF-SIMS Imaging”
  • Yurimoto, Hisayoshi (Hokkaido University, Japan) “Analysis of Solar Wind Samples by NASA Genesis Mission”

SIMS Keynote Industrial Speakers

  • Barnes, Jean-Paul, CEA-LETI-Grenoble, France), “Correlative Microscopy and Data Analysis for Semiconductor Technology Applications”
  • Fahey, Al (Corning Incorporated, USA), “The Characteristics of Multi-material Depth Profiles With Low-Energy Atomic and Diatomic Ion Beams and Cluster Ion Beams of Ar and O2″
  • Magee, Charles (EAG Laboratories (Retired), USA), “SIMS Quantification: Do You Remember When a Factor of Two Was Good Enough?”
  • Spool, Alan (Western Digital, USA), “Characterizing and Quantifying Perfluoropolyether Lubricants on Magnetic Recording Disks”
  • Vlasak, Paul (Dow Chemical Company, USA), “Multidimensional Chemical Imaging of Polymeric Materials Using TOF-SIMS with GCIB Sputtering”